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📄 Automated Defect Detection for Mass-Produced Electronic Components Based on YOLO Object Detection Models
2025-10-07
Авторы:

Wei-Lung Mao, Chun-Chi Wang, Po-Heng Chou, Yen-Ting Liu

Саммари на русском не найдено
Доступные поля: ['id', 'arxiv_id', 'title', 'authors', 'abstract', 'summary_ru', 'categories', 'published_date', 'created_at']
Annotation:
Since the defect detection of conventional industry components is time-consuming and labor-intensive, it leads to a significant burden on quality inspection personnel and makes it difficult to manage product quality. In this paper, we propose an automated defect detection system for the dual in-line package (DIP) that is widely used in industry, using digital camera optics and a deep learning (DL)-based model. The two most common defect categories of DIP are examined: (1) surface defects, and (2...
ID: 2510.01914v2 cs.CV, cs.AI, cs.LG, eess.SP, 68T07, 68U10, I.4.8; I.2.10
arXiv PDF
📄 Automated Defect Detection for Mass-Produced Electronic Components Based on YOLO Object Detection Models
2025-10-04
Авторы:

Wei-Lung Mao, Chun-Chi Wang, Po-Heng Chou, Yen-Ting Liu

Саммари на русском не найдено
Доступные поля: ['id', 'arxiv_id', 'title', 'authors', 'abstract', 'summary_ru', 'categories', 'published_date', 'created_at']
Annotation:
Since the defect detection of conventional industry components is time-consuming and labor-intensive, it leads to a significant burden on quality inspection personnel and makes it difficult to manage product quality. In this paper, we propose an automated defect detection system for the dual in-line package (DIP) that is widely used in industry, using digital camera optics and a deep learning (DL)-based model. The two most common defect categories of DIP are examined: (1) surface defects, and (2...
ID: 2510.01914v1 cs.CV, cs.AI, cs.LG, eess.SP, 68T07, 68U10, I.4.8; I.2.10
arXiv PDF