Multi-Task Deep Learning for Surface Metrology
2510.20339v1
physics.app-ph, cs.AI, cs.LG, stat.AP, stat.ML
2025-10-25
Авторы:
D. Kucharski, A. Gaska, T. Kowaluk, K. Stepien, M. Repalska, B. Gapinski, M. Wieczorowski, M. Nawotka, P. Sobecki, P. Sosinowski, J. Tomasik, A. Wojtowicz
Abstract
A reproducible deep learning framework is presented for surface metrology to
predict surface texture parameters together with their reported standard
uncertainties. Using a multi-instrument dataset spanning tactile and optical
systems, measurement system type classification is addressed alongside
coordinated regression of Ra, Rz, RONt and their uncertainty targets
(Ra_uncert, Rz_uncert, RONt_uncert). Uncertainty is modelled via quantile and
heteroscedastic heads with post-hoc conformal calibration to yield calibrated
intervals. On a held-out set, high fidelity was achieved by single-target
regressors (R2: Ra 0.9824, Rz 0.9847, RONt 0.9918), with two uncertainty
targets also well modelled (Ra_uncert 0.9899, Rz_uncert 0.9955); RONt_uncert
remained difficult (R2 0.4934). The classifier reached 92.85% accuracy and
probability calibration was essentially unchanged after temperature scaling
(ECE 0.00504 -> 0.00503 on the test split). Negative transfer was observed for
naive multi-output trunks, with single-target models performing better. These
results provide calibrated predictions suitable to inform instrument selection
and acceptance decisions in metrological workflows.